ANALYSIS OF EXTENDING THE FIELD-OF-VIEW OF REVERSE-MICROSCOPE IMAGING SYSTEM AT MILLIMETER-WAVELENGTHS.

Autor:	W. B. Dou1, X. D. Deng, S. P.1, J. H. Pan, S. P.2
Zdroj:	Journal of Electromagnetic Waves & Applications. 2004, Vol. 18 Issue 4, p469-479. 11p.
Databáze:	Academic Search Ultimate
Externí odkaz:	Zobrazit plný text záznamu