Residual stress and electrical properties of Pb(Zr0.52,Ti0.48)O3 thin films RF sputtered directly on Cu foils.
Autor: | Walenza‐Slabe, Joel1, Gibbons, Brady J.1 brady.gibbons@oregonstate.edu |
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Zdroj: | Journal of the American Ceramic Society. Nov2017, Vol. 100 Issue 11, p5141-5150. 10p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |