Residual stress and electrical properties of Pb(Zr0.52,Ti0.48)O3 thin films RF sputtered directly on Cu foils.

Autor: Walenza‐Slabe, Joel1, Gibbons, Brady J.1 brady.gibbons@oregonstate.edu
Zdroj: Journal of the American Ceramic Society. Nov2017, Vol. 100 Issue 11, p5141-5150. 10p.
Databáze: Academic Search Ultimate