Scanning near-field lithography with high precision flexure orientation stage control.

Autor: Qin, Jin1, Zhang, Liang1, Tan, Haosen1, Wang, Liang1 Lwang121@ustc.edu.cn
Zdroj: Applied Physics A: Materials Science & Processing. Sep2017, Vol. 123 Issue 9, p1-7. 7p. 2 Color Photographs, 3 Diagrams, 2 Graphs.
Databáze: Academic Search Ultimate