Methods of functional-logic simulation of radiation-induced failures of electronic systems based on the fuzzy state machine model.
| Autor: | Barbashov, V.1 VMBarbashov@MEPHI.ru, Kalashnikov, O.1 |
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| Zdroj: | Russian Microelectronics. May2017, Vol. 46 Issue 3, p155-161. 7p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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