Achieving metrological precision limits through postselection.
| Autor: | Alves, G. Bié1, Pimentel, A.1, Hor-Meyll, M.1, Walborn, S. P.1, Davidovich, L.1, de Matos Filho, R. L.1 |
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| Zdroj: | Physical Review A: Atomic, Molecular & Optical Physics. Jan2017, Vol. 95 Issue 1, p1-1. 1p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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