Characterization of the Diamond Wire Sawing Process for Monocrystalline Silicon by Raman Spectroscopy and SIREX Polarimetry.
| Autor: | Würzner, Sindy1 sindy.wuerzner@thm.fraunhofer.de, Herms, Martin2 martin.herms@pvatepla.com, Kaden, Thomas1 thomas.kaden@thm.fraunhofer.de, Möller, Hans Joachim1 hans.joachim.moeller@ise.fraunhofer.de, Wagner, Matthias2 matthias.wagner@pvatepla.com |
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| Zdroj: | Energies (19961073). Apr2017, Vol. 10 Issue 4, p414. 12p. |
| Databáze: | Academic Search Ultimate |
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