Defect structure of epitaxial layers of III nitrides as determined by analyzing the shape of X-ray diffraction peaks.
| Autor: | Kyutt, R.1 r.kyutt@mail.ioffe.ru |
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| Zdroj: | Technical Physics. Apr2017, Vol. 62 Issue 4, p598-603. 6p. 2 Charts, 6 Graphs. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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