Nano-Tomography of Porous Geological Materials Using Focused Ion Beam-Scanning Electron Microscopy.
| Autor: | Yang Liu1,2 Y.Liu4@uu.nl, King, Helen E.2 H.E.King@uu.nl, van Huis, Marijn A.1 M.A.vanHuis@uu.nl, Drury, Martyn R.2 M.R.Drury@uu.nl, Plümper, Oliver2 O.Plumper@uu.nl |
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| Zdroj: | Minerals (2075-163X). Dec2016, Vol. 6 Issue 4, p104. 19p. |
| Databáze: | Academic Search Ultimate |
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