New Atomic Force Microscope Facilitates Faster Workflow for Nanoscale In Situ Applications.

Autor:	Rankl, Christian1, Kada, Gerald1, Wu, Shijie1, Ghimire, Anil1
Zdroj:	Microscopy Today. Nov2016, Vol. 24 Issue 6, p26-31. 6p.
Databáze:	Academic Search Ultimate
Externí odkaz:	Zobrazit plný text záznamu