Intermittent-contact Scanning Electrochemical Microscopy (IC-SECM) as a Quantitative Probe of Defects in Single Crystal Boron Doped Diamond Electrodes.
| Autor: | Tomlinson, Lucy I.1, Patten, Hollie V.1, Green, Ben L.2, Iacobini, James1, Meadows, Katherine E.1,3, McKelvey, Kim1,3, Unwin, Patrick R.1, Newton, Mark E.2, Macpherson, Julie V.1 j.macpherson@warwick.ac.uk |
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| Zdroj: | Electroanalysis. Oct2016, Vol. 28 Issue 10, p2297-2302. 6p. |
| Databáze: | Academic Search Ultimate |
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