Three-beam X-ray diffraction -- profile analysis.

Autor: Thorkildsen, Gunnar1 gunnar.thorkildsen@tn.his.no, Larsen, Helge B.2, Weckert, Edgar3, Semmingsen, Dag4
Zdroj: Journal of Applied Crystallography. Dec2003, Vol. 36 Issue 6, p1324-1333. 10p.
Databáze: Academic Search Ultimate