Three-beam X-ray diffraction -- profile analysis.
Autor: | Thorkildsen, Gunnar1 gunnar.thorkildsen@tn.his.no, Larsen, Helge B.2, Weckert, Edgar3, Semmingsen, Dag4 |
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Zdroj: | Journal of Applied Crystallography. Dec2003, Vol. 36 Issue 6, p1324-1333. 10p. |
Databáze: | Academic Search Ultimate |
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