Polytype distribution of circumstellar silicon carbide: microstructural characterization by transmission electron microscopy

Autor: Daulton, T. L.1,2 tdaulton@nrlscc.navy.mil, Bernatowicz, T. J.3, Lewis, R. S.4, Messenger, S.3, Stadermann, F. J.3, Amari, S.3
Zdroj: Geochimica et Cosmochimica Acta. Dec2003, Vol. 67 Issue 24, p4743. 25p.
Databáze: Academic Search Ultimate