Microstructure and Residual Stress Measurement of Ag/Glass Thin Films Using In-Situ High-Temperature X-ray Diffraction.
| Autor: | Zolanvari, A.1, Sagha, S. Hasan1, Eshaghi, F.1, Shahedi, Z.1, Zendehnam, A.1 |
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| Zdroj: | Armenian Journal of Physics. 2016, Vol. 9 Issue 1, p15-19. 5p. 2 Charts, 1 Graph. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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