The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures.
| Autor: | Ievtukh, V. A.1 v.ievtukh@gmail.com, Ulyanov, V. V.1, Nazarov, A. N.1 |
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| Zdroj: | Semiconductor Physics, Quantum Electronics & Optoelectronics. 2016, Vol. 19 Issue 1, p116-123. 8p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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