CROSS-SECTIONAL THERMAL IMAGING OF A METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR.
| Autor: | Ohmyoung Kwon1 omkwon@korea.ac.kr, Majumdar, Arun1 |
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| Zdroj: | Microscale Thermophysical Engineering. Oct-Dec2003, Vol. 7 Issue 4, p349-354. 6p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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