Characterization of grain boundaries in CdTe polycrystalline films.
| Autor: | Tetyorkin, V. V.1 teterkin@isp.kiev.ua, Sukach, A. V.1, Boiko, V. A.1, Tkachuk, A. I.2 |
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| Zdroj: | Semiconductor Physics, Quantum Electronics & Optoelectronics. 2015, Vol. 18 Issue 4, p428-432. 5p. |
| Databáze: | Academic Search Ultimate |
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