Thermal annealing and evolution of defects in neutron-irradiated cubic SiC.

Autor: Bratus, V. Ya.1 v_bratus@isp.kiev.ua, Melnyk, R. S.1 melnyk_rs@yahoo.com, Shanina, B. D.1 shanina_bela@rambler.ru, Okulov, S. M.1 okulov@isp.kiev.ua
Zdroj: Semiconductor Physics, Quantum Electronics & Optoelectronics. 2015, Vol. 18 Issue 4, p403-409. 7p.
Databáze: Academic Search Ultimate