Modeling and characterization of capacitive coupling in trench-isolated structures on SOI substrates
Autor: | Heinle, Ulrich1, Vestling, Lars lars.vestling@angstrom.uu.se, Olsson, Jörgen1 |
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Zdroj: | Solid-State Electronics. Jan2004, Vol. 48 Issue 1, p43. 7p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |