Modeling and characterization of capacitive coupling in trench-isolated structures on SOI substrates

Autor: Heinle, Ulrich1, Vestling, Lars lars.vestling@angstrom.uu.se, Olsson, Jörgen1
Zdroj: Solid-State Electronics. Jan2004, Vol. 48 Issue 1, p43. 7p.
Databáze: Academic Search Ultimate