Temperature dependences of the photoluminescence intensities of centers in silicon implanted with erbium and oxygen ions.

Autor: Sobolev, N.1 nick@sobolev.ioffe.rssi.ru, Shtel'makh, K., Kalyadin, A.1, Shek, E.1
Zdroj: Semiconductors. Dec2015, Vol. 49 Issue 12, p1651-1654. 4p.
Databáze: Academic Search Ultimate