EMERGING TECHNIQUES IN ATOMIC FORCE MICROSCOPY: DIAMOND MILLING AND ELECTROSTATIC FORCE MICROSCOPY.
Autor: | Ippolito, Stephen1, Zumwalt, Sean1 sean_zumwalt@dcgsystems.com, Erickson, Andy1 |
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Zdroj: | Electronic Device Failure Analysis. Aug2015, Vol. 17 Issue 3, p4-10. 6p. |
Databáze: | Academic Search Ultimate |
Externí odkaz: |