EMERGING TECHNIQUES IN ATOMIC FORCE MICROSCOPY: DIAMOND MILLING AND ELECTROSTATIC FORCE MICROSCOPY.

Autor: Ippolito, Stephen1, Zumwalt, Sean1 sean_zumwalt@dcgsystems.com, Erickson, Andy1
Zdroj: Electronic Device Failure Analysis. Aug2015, Vol. 17 Issue 3, p4-10. 6p.
Databáze: Academic Search Ultimate