Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors.
| Autor: | Slipokurov, V. S.1, Dub, M. M.2, Tkachenko, A. K.2, Kudryk, Ya. Ya.1 kudryk@isp.kiev.ua |
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| Zdroj: | Semiconductor Physics, Quantum Electronics & Optoelectronics. 2015, Vol. 18 Issue 2, p144-146. 3p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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