Two-dimensional in situ metrology of X-ray mirrors using the speckle scanning technique.
| Autor: | Wang, Hongchang1, Kashyap, Yogesh1, Laundy, David1, Sawhney, Kawal1 |
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| Zdroj: | Journal of Synchrotron Radiation. Jul2015, Vol. 22 Issue 4, p925-929. 5p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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