Effect of leaf and spike morphological traits on the relationship between spectral reflectance indices and yield in wheat.
| Autor: | Gutierrez, Mario1 (AUTHOR), Reynolds, Matthew Paul2 (AUTHOR) m.reynolds@cgiar.org, Klatt, Arthur Raymond3 (AUTHOR) |
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| Zdroj: | International Journal of Remote Sensing. Feb2015, Vol. 36 Issue 3, p701-718. 18p. 6 Charts, 4 Graphs. |
| Databáze: | Academic Search Ultimate |
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