Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method.
| Autor: | Sheremet, V. N.1 VolodymyrSheremet@gmail.com |
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| Zdroj: | Semiconductor Physics, Quantum Electronics & Optoelectronics. 2014, Vol. 17 Issue 4, p394-397. 4p. |
| Databáze: | Academic Search Ultimate |
| Externí odkaz: |
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