The effects of post-deposition annealing on the microstructure of electron-beam evaporated indium tin oxide thin films

Autor: Kiely, C. J., Hill, A. E., Pilkington, R. D., Diniz, A. S. A. C., Elfallal, I.
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Zdroj: Renewable Energy: An International Journal. Nov1994, Vol. 5 Issue 1-4, p209. 0p.
Databáze: GreenFILE