Low-Capture-Power X-filling Method Based on Architecture Using Selection Expansion
| Autor: | Yu-Ting Chung, 鍾昱廷 |
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| Rok vydání: | 2018 |
| Druh dokumentu: | 學位論文 ; thesis |
| Popis: | 106 In the system-on-chip (SOC) design, there are a huge volume of test data. The arrival of test data compression is because of lacking in channel capacity and the restricted memory of Automatic Test Equipment (ATE). Therefore, the technique of test data compression is very important to save time and memory. Because of MISR’s characteristic, we can use one ATE data to run many times. In this paper, we use selection with Flip-Flops to spread MISR data. Each Flip-Flop of MISR is connecting with 2 MUXs of selection. In addition, selection connected with MISR. To use Flip-Flops so we can restore bits in it, just changing Flip-Flops bits when data changing. It is not frequently changing of the bits of Flip-Flops, so we can decrease power consumption. In our architecture, we already saved sift power. In this paper, we will approach a Low-Capture-Power X-Filling Method to decrease shift times of Flip-Flops. Compare to Random X-filling Method, the Fault Coverage will be the same but less average and maximum shift times. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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