Potential profiling of the nanometer-scale charge-depletion layer in n-ZnO/p-NiO junction using photoemission spectroscopy
| Autor: | Ishida, Yukiaki, Fujimori, Atsushi, Ohta, Hiromichi, Hirano, Masahiro, Hosono, Hideo |
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| Jazyk: | angličtina |
| Rok vydání: | 2006 |
| Druh dokumentu: | Article(publisher) |
| ISSN: | 0003-6951 |
| DOI: | 10.1063/1.2358858 |
| Databáze: | Networked Digital Library of Theses & Dissertations |
| Externí odkaz: |
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