Diffraction of Long Wavelength X-Ray
| Autor: | Henke, Burton L. |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 1953 |
| Druh dokumentu: | Diplomová práce |
| DOI: | 10.7907/2JGQ-WN90 |
| Popis: | The theory and application of diffraction by long, x-ray wavelengths are discussed. Four methods obtaining the diffraction pattern are described, namely (1) the double-crystal spectrometer, (2) the annular slit system, (3) the concave mica, point-focusing monochromator, and (4) the total-reflection, point-focusing system. The design and construction of the total-reflection equipment is described in detail. This method is applied to the measurement of the Dow latex particles. |
| Databáze: | Networked Digital Library of Theses & Dissertations |
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