Gap Junctions Formed by Connexins 26 and 32 Alone and in Combination are Differently Affected by Applied Voltage

Autor:	Barrio, Luis C., Suchyna, Thomas, Bargiello, Thaddeus, Xu, Lie Xian, Roginski, Raymond S., Nicholson, Bruce J.
Zdroj:	Proceedings of the National Academy of Sciences of the United States of America, 1991 Oct 01. 88(19), 8410-8414.
Databáze:	JSTOR Journals
Externí odkaz:	https://www.jstor.org/stable/2357949 Zobrazit plný text záznamu