High‐Q RF inductors on 20 Ω.cm silicon realized through wafer‐level packaging techniques

Autor: Carchon, G.J., De Raedt, W., Beyne, E.
Zdroj: Microelectronics International: An International Journal, 2003, Vol. 20, Issue 1, pp. 26-30.
Databáze: Emerald Insight