Sub-20 nm multilayer nanopillar patterning for hybrid SET/CMOS integration

Autor: Pourteau, M.-L., Gharbi, A., Brianceau, P., Dallery, J.-A., Laulagnet, F., Rademaker, G., Tiron, R., Engelmann, H.-J., von Borany, J., Heinig, K.-H., Rommel, M., Baier, L.
Zdroj: In Micro and Nano Engineering November 2020 9
Databáze: ScienceDirect