Fractal analysis on Ag2O thin film using a data-driven approach

Autor:	Hui, Jian, Hu, Qingyun, Lu, Yao, Li, Tianyi, Dong, Xianping, Ren, Yang, Wang, Hong
Zdroj:	In Surfaces and Interfaces June 2024 49
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect