Deep Learning-based Sequence Modeling for Advanced Process Control in Semiconductor Manufacturing
Autor: | Zuanna, Filippo Dalla, Gentner, Natalie, Susto, Gian Antonio |
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Zdroj: | In IFAC PapersOnLine 2023 56(2):8744-8751 |
Databáze: | ScienceDirect |
Externí odkaz: |