Nanometer – Thick titanium film as a silicon migration barrier
Autor: | Fawaeer, Saleh H., Al-Qaisi, Wala’ M., Sedláková, Vlasta, Mousa, Marwan S., Knápek, Alexandr, Trunec, Martin, Sobola, Dinara |
---|---|
Zdroj: | In Materials Today Communications August 2024 40 |
Databáze: | ScienceDirect |
Externí odkaz: |