Nanometer – Thick titanium film as a silicon migration barrier
| Autor: | Fawaeer, Saleh H., Al-Qaisi, Wala’ M., Sedláková, Vlasta, Mousa, Marwan S., Knápek, Alexandr, Trunec, Martin, Sobola, Dinara |
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| Zdroj: | In Materials Today Communications August 2024 40 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect