A cost-effective and highly robust triple-node-upset self-recoverable latch design based on dual-output C-elements
| Autor: | Xu, Hui, Tang, Lin, Ma, Ruijun, Liang, Huaguo, Huang, Zhengfeng, Ni, Tianming, Li, Jiuqi, Ai, Xiaodong |
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| Zdroj: | In Microelectronics Journal November 2024 153 |
| Databáze: | ScienceDirect |
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