Nanostructural analysis of ZnO:Al thin films for carrier-transport mechanisms
Autor: | Lee, Seung-Yoon, Lee, Woojin, Nahm, Changwoo, Kim, Jongmin, Byun, Sujin, Hwang, Taehyun, Lee, Byung-Kee, Jang, Young Il, Lee, Sungeun, Lee, Heon-Min, Park, Byungwoo |
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Zdroj: | In Current Applied Physics June 2013 13(4):775-778 |
Databáze: | ScienceDirect |
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