Nanostructural analysis of ZnO:Al thin films for carrier-transport mechanisms

Autor: Lee, Seung-Yoon, Lee, Woojin, Nahm, Changwoo, Kim, Jongmin, Byun, Sujin, Hwang, Taehyun, Lee, Byung-Kee, Jang, Young Il, Lee, Sungeun, Lee, Heon-Min, Park, Byungwoo
Zdroj: In Current Applied Physics June 2013 13(4):775-778
Databáze: ScienceDirect