Stoichiometry loss induced by ionic bombardment of InP surfaces: A challenge for electrochemistry combined with XPS
| Autor: | Béchu, S., Aureau, D., Vigneron, J., Gonçalves, A-M., Frégnaux, M., Bouttemy, M., Etcheberry, A. |
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| Zdroj: | In Electrochemistry Communications August 2020 117 |
| Databáze: | ScienceDirect |
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