Thermal dependence of the current in TiN/Ti/HfO2/W memristors at different intermediate conduction states

Autor:	Jiménez-Molinos, F., Vinuesa, G., García, H., Dueñas, S., Castán, H., González, M.B., Campabadal, F., Roldán, J.B.
Zdroj:	In Materials Science in Semiconductor Processing 15 August 2024 179
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect