Dislocation of high-quality large DCP-ZnTe substrate examined by photoluminescence and X-ray topography
| Autor: | Yoshino, K., Kakeno, T., Yoneta, M., Yonenaga, I. |
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| Zdroj: | In Materials Science in Semiconductor Processing 2006 9(1):45-48 |
| Databáze: | ScienceDirect |
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