Scanning X-ray diffraction peak profile analysis in deformed Cu-polycrystals by synchrotron radiation
| Autor: | Zehetbauer, M. a, Ungár, T. b, *, Kral, R. a, Borbély, A. b, Schafler, E. a, Ortner, B. c, Amenitsch, H. d, Bernstorff, S. e |
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| Zdroj: | In Acta Materialia 1999 47(3):1053-1061 |
| Databáze: | ScienceDirect |
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