The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction
| Autor: | Fancher, C.M., Brewer, S., Chung, C.C., Röhrig, S., Rojac, T., Esteves, G., Deluca, M., Bassiri-Gharb, N., Jones, J.L. |
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| Zdroj: | In Acta Materialia March 2017 126:36-43 |
| Databáze: | ScienceDirect |
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