Normal spectral emissivity measurement of thermal management materials for electronic components in the 2–14 μm range
| Autor: | Wang, Yang, Zhao, Yongao, Zhang, Xu, Zhang, Yufeng, Dai, Jingmin |
|---|---|
| Zdroj: | In Infrared Physics and Technology November 2024 142 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect