Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT

Autor: De Vetter, L., Cnudde, V., Masschaele, B., Jacobs, P.J.S., Van Acker, J.
Zdroj: In Materials Characterization 2006 56(1):39-48
Databáze: ScienceDirect