Local inspection of refractive index and thickness of thick transparent layers using spectral reflectance measurements in low coherence scanning interferometry
| Autor: | Claveau, Rémy, Montgomery, Paul, Flury, Manuel, Ferblantier, Gérald |
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| Zdroj: | In Optical Materials December 2018 86:100-105 |
| Databáze: | ScienceDirect |
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