Surface plasmon resonance spectrometer in the double prism configuration: Fast characterization of the thickness and dielectric constant dispersion of thin films

Autor: da Silva Rodrigues, Debora Cristina, de Oliveira, Gabriel Ferrari, dos Santos Romero, André Luís, Vieira, Nirton Cristi Silva, Vivas, Marcelo Gonçalves
Zdroj: In Sensors and Actuators: A. Physical 1 January 2025 381
Databáze: ScienceDirect