Surface plasmon resonance spectrometer in the double prism configuration: Fast characterization of the thickness and dielectric constant dispersion of thin films
Autor: | da Silva Rodrigues, Debora Cristina, de Oliveira, Gabriel Ferrari, dos Santos Romero, André Luís, Vieira, Nirton Cristi Silva, Vivas, Marcelo Gonçalves |
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Zdroj: | In Sensors and Actuators: A. Physical 1 January 2025 381 |
Databáze: | ScienceDirect |
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