Atomic force microscope for planetary applications
| Autor: | Akiyama, T., Gautsch, S., de Rooij, N.F., Staufer, U., Niedermann, Ph., Howald, L., Müller, D., Tonin, A., Hidber, H.-R., Pike, W.T. *, Hecht, M.H. |
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| Zdroj: | In Sensors & Actuators: A. Physical 2001 91(3):321-325 |
| Databáze: | ScienceDirect |
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