Dielectric properties of ambient temperature grown nanocrystalline ZrTiO 4 thin films using DC magnetron sputtering

Autor: Pamu, D., Sudheendran, K., Ghanashyam Krishna, M., James Raju, K.C.
Zdroj: In Materials Science & Engineering B 2010 168(1):208-213
Databáze: ScienceDirect