Thermodynamic modeling framework with experimental investigation of the large-scale bonded area and local void in Cu-Cu bonding interface for advanced semiconductor packaging

Autor: Oh, Sung-Hyun, Lee, Hyun-Dong, Lee, Jae-Uk, Park, Sung-Ho, Cho, Won-Seob, Park, Yong-Jin, Haag, Alexandra, Watanabe, Soichi, Arnold, Marco, Lee, Hoo-Jeong, Lee, Eun-Ho
Zdroj: In International Journal of Plasticity September 2024 180
Databáze: ScienceDirect