Sequential focused ion beam scanning electron microscopy analyses for monitoring cycled-induced morphological evolution in battery composite electrodes. Silicon-graphite electrode as exemplary case

Autor: Vanpeene, Victor, Soucy, Patrick, Xiong, Jianhan, Dupré, Nicolas, Lestriez, Bernard, Roué, Lionel
Zdroj: In Journal of Power Sources 30 June 2021 498
Databáze: ScienceDirect